The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Aug. 10, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Fa-Long Luo, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 1/20 (2006.01); H04N 23/617 (2023.01); H04N 25/75 (2023.01); H04N 25/772 (2023.01); H04N 25/79 (2023.01);
U.S. Cl.
CPC ...
H04N 25/79 (2023.01); G06T 1/20 (2013.01); H04N 23/617 (2023.01); H04N 25/75 (2023.01); H04N 25/772 (2023.01);
Abstract

Methods and apparatus for performing multi-step image processing using a reconfigurable fabric device (RFD) in place of multiple discrete ICs. In one embodiment, the methods and apparatus operate according to a flexible time-divided schedule, and the processing is configured to process image sensor data by at least: (i) receiving RAW image data, programming an RFD to operate as a first functional unit such as an image signal processor (ISP), using the programmed RFD to perform image signal processing on the RAW image data, storing the ISP-result in temporary memory; and (ii) programming the RFD to operate as a second functional unit (e.g., deep learning accelerator (DLA)), using the programmed RFD to read out ISP-result from the temporary memory, perform deep learning processing on the ISP-result, and storing the DLA-result back into the temporary memory. In one variant, an on-die controller and memory are used in support of the RFD operations, thereby enabling a single-die processing solution.


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