The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

May. 16, 2023
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventor:

Hiroyuki Onuma, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3171 (2013.01); G01R 31/31905 (2013.01);
Abstract

An error rate measurement apparatus includes a display control unit, an operation display unit, and a control unit. The display control unit displays a firsts coefficient value in a selectable manner by tabs of a number corresponding to a Full Swing value, performs matrix display on a display screen by using each one of combinations of each second coefficient value and each third coefficient value in the first coefficient value on the selected tab, and displays each coefficient value on the display screen in a three-dimensional bird-eye view by using each second coefficient value and each third coefficient value as a combination of a horizontal direction coordinate axis and a vertical direction coordinate axis and using the first coefficient value as a depth direction coordinate axis. The operation display unit selects a range including at least one cell as a scanning target in the matrix display or a bird-eye display.


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