The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Apr. 12, 2018
Jeol Ltd., Tokyo, JP;
Yuichi Inoue, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
An automatic analyzer includes a control unit that performs a process when a sample necessary to perform measurement for measurement content selected on an item selection screen is not arranged in a sample-container array unit. The process includes referring to the measurement content selected on the item selection screen and availability information that is information indicating whether each position in the sample-container array unit is available. A position in the sample-container array unit at which a container containing the sample necessary to perform measurement for the selected measurement content is to be arranged is specified in accordance with a specified arrangement rule, and information on the specified position in the sample-container array unit is displayed on a display unit.