The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Dec. 28, 2022
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Keiji Nomaru, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01B 11/03 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); G01B 11/03 (2013.01); G01B 11/06 (2013.01); G01B 11/0625 (2013.01); G01B 11/0675 (2013.01); H01L 22/12 (2013.01); G01B 2210/56 (2013.01);
Abstract

A measuring unit of a measuring apparatus includes a light source that emits light in a predetermined wavelength region, a condenser lens that applies the light emitted by the light source, to a plate-shaped workpiece held by a chuck table, a collimating lens that forms return light reflected by the plate-shaped workpiece into parallel light, a transmission filter that transmits interference light of the return light formed into the parallel light, a sensor that has coordinates for receiving the interference light transmitted through the transmission filter and detecting light intensity, and a controller that determines a coordinate position at which the light intensity detected by the sensor is high, as the thickness or height of the plate-shaped workpiece.


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