Single error correct double error detect (secded) error coding with burst error detection capability

Abstract

An integrated circuit (IC) device is disclosed. The IC device includes an error encoder to receive a word of k bits and to encode the word using a G-matrix to generate an encoded word of n bits. The n bits include the k bits and n-k check bits. The G matrix is based on a parity check matrix defining a single error correct, double error detect, and burst error detect (SECDEDBED) code. An error decoder receives the encoded word and applies the parity check matrix to the encoded word. The parity check matrix is configured to generate a syndrome from the encoded word. The syndrome being used to detect a random double bit error, a random single bit error, and a burst error of between two and m bits within m adjacent bits of an m-bit subset of the data word starting from an m-bit boundary of the word of k bits, and where m<n-k.