The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
May. 31, 2022
Tokyo Electron Limited, Tokyo, JP;
Kazuhisa Nakama, Fuchu, JP;
Nobuyuki Ishibashi, Fuchu, JP;
Tatsuya Hirosawa, Fuchu, JP;
Masahiro Koyanagi, Fuchu, JP;
Nobuhiko Sasaki, Tokyo, JP;
Tokyo Electron Limited, Tokyo, JP;
Abstract
An image restriction method includes: acquiring image data by a capturing part, the image data being obtained by capturing a space in which a monitoring target object is disposed; acquiring capturing position data indicating a capturing position of the capturing part in the space; acquiring shape information indicating a three-dimensional shape of the monitoring target object; specifying a disposition position of the monitoring target object in the space; specifying a shape of the monitoring target object disposed at the disposition position, based on the capturing position data, the shape information, and the disposition position, and specifying a region of the monitoring target object in an image of the acquired image data, based on a result obtained by the specifying the shape; performing a masking process on a region other than the specified region of the monitoring target object, in the image of the acquired image data; and outputting mask-processed image data.