The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Jun. 15, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Shen Zhou, Shanghai, CN;

Xiaoming Du, Shanghai, CN;

Cong Li, Shanghai, CN;

Kuljit S. Bains, Olympia, WA (US);

Rajat Agarwal, Portland, OR (US);

Murugasamy K. Nachimuthu, Beaverton, OR (US);

Maciej Lawniczak, Gdansk, PL;

Chao Yan Tang, Shanghai, CN;

Mariusz Oriol, Gdynia, PL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/073 (2013.01); G06F 11/0751 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01);
Abstract

A system can predict memory device failure through identification of correctable error patterns based on the memory architecture. The failure prediction can thus account for the circuit-level of the memory rather than the mere number or frequency of correctable errors. A failure prediction engine correlates hardware configuration of the memory device with correctable errors (CEs) detected in data of the memory device to predict an uncorrectable error (UE) based on the correlation.


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