The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jan. 17, 2023
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Masaru Ishida, Kanagawa, JP;

Hiroki Nakajima, Kanagawa, JP;

Mikio Shibukawa, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/90 (2023.01); B65G 15/24 (2006.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
H04N 23/90 (2023.01); H04N 23/56 (2023.01); B65G 15/24 (2013.01);
Abstract

To provide an inspection apparatus capable of simultaneously picking up images of one side and the other side of an inspection item with an image pickup device. An inspection apparatusincludes a first conveyance unitand a second conveyance unitarranged with a predetermined gap G and inspects a workpiece W when the workpiece W passes over the predetermined gap G. The inspection apparatusincludes a first image pickup deviceprovided on one side with the predetermined gap G in a direction intersecting with a conveyance direction of the workpiece W, a second image pickup deviceprovided on the other side, a first light emission devicedisposed at a position facing the first image pickup device, and a second light emission devicedisposed at a position facing the second image pickup device


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Ishida, Masaru. (2025). Inspection apparatus (U.S. Patent No. 12256158). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12256158

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