The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jun. 25, 2018
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Yao-Jen Chang, Princeton, NJ (US);

Stefan Kluckner, Berlin, DE;

Benjamin S. Pollack, Jersey City, NJ (US);

Terrence Chen, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06V 20/52 (2022.01); G01N 21/253 (2013.01); G01N 35/00732 (2013.01); G01N 35/04 (2013.01); G01N 2035/0418 (2013.01); G01N 2035/0498 (2013.01);
Abstract

Embodiments provide a method of using image-based tube top circle detection based on multiple candidate selection to localize the tube top circle region in input images. According to embodiments provided herein, the multi-candidate selection enhances the robustness of tube circle detection by making use of multiple views of the same tube to improve the robustness of tube top circle detection. With multiple candidates extracted from images under different viewpoints of the same tube, the multi-candidate selection algorithm selects an optimal combination among the candidates and provides more precise measurement of tube characteristics. This information is invaluable in an IVD environment in which a sample handler is processing the tubes and moving the tubes to analyzers for testing and analysis.


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