The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Dec. 03, 2021
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Umesh Adiga, Portland, OR (US);
Mark Biedrzycki, Beaverton, OR (US);
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 3/40 (2024.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 7/30 (2017.01); G06V 10/25 (2022.01); H01J 37/22 (2006.01); H01J 37/31 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 3/40 (2013.01); G06T 7/0004 (2013.01); G06T 7/13 (2017.01); G06T 7/30 (2017.01); G06V 10/25 (2022.01); H01J 37/222 (2013.01); H01J 37/31 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30164 (2013.01); G06T 2207/30204 (2013.01);
Abstract
Fiducial coordinates are obtained by aligning template with region of interest extracted from a workpiece image. Image values in the region of interest are projected along a template axis and the project values evaluated to establish a fiducial location which can be used as a reference location for locating workpiece areas for ion beam milling or other processing.