The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jan. 26, 2022
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Yuto Noda, Nirasaki, JP;

Shota Yamazaki, Nirasaki, JP;

Yuichi Takenaga, Nirasaki, JP;

Toshiyuki Fukumoto, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G05B 13/02 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/042 (2013.01); G05B 13/0265 (2013.01); G05B 23/0235 (2013.01); G05B 23/0262 (2013.01);
Abstract

An information processing device includes: a machine learning model selection part configured to select a machine learning model appropriate for a data set used for learning of the machine learning model; a calculation part configured to perform an optimization calculation by using the selected machine learning model to calculate process conditions that can achieve a target process result, predicted values of a process result corresponding to each of the process conditions, and reliability of the predicted values; a process condition selection part configured to select, among the process conditions that can achieve the target process result, one or more process conditions according to the predicted values of the process result and the reliability of the predicted values; and a display controller configured to display the selected process conditions, the predicted values of the process result corresponding to each of the selected process conditions, and the reliability of the predicted values.


Find Patent Forward Citations

Loading…