The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Dec. 02, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Olawunmi Akinlemibola, Lanham, MD (US);

Jennifer I. Bennett, Rochester, MN (US);

Theron Lee Lewis, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
G01B 15/04 (2013.01);
Abstract

A method for obtaining three-dimension measurements for an object utilizing a population of radio-frequency identification (RFID) chips in a medium includes placing the object into a container with the population of RFID chips in the medium. The method also includes capturing a plurality of coordinates for the population of RFID chips in the medium, where a set of coordinates from the plurality of coordinates correspond to each RFID chip from the population of RFID chips. The method includes plotting the plurality of coordinates for the population of RFID chips in the medium, wherein a plot of the plurality of coordinates provides a three-dimensional image of the object.


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