The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Aug. 11, 2022
Applicant:

Semes Co., Ltd., Chungcheongnam-do, KR;

Inventors:

Han Lim Kang, Seoul, KR;

Suk Won Jang, Gyeonggi-do, KR;

Jae Duck Lee, Gyeonggi-do, KR;

Won Yong Jin, Jeollabuk-do, KR;

Assignee:

SEMES CO., LTD., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2139 (2013.01); G01B 11/24 (2013.01);
Abstract

A meniscus measuring method capable of quickly and accurately measuring meniscus positions in a plurality of nozzles of an inkjet head can be provided. The meniscus measuring method comprises providing a head unit capable of discharging ink through a plurality of nozzles, adhering ink remaining in the plurality of nozzles to a film to form a detection pattern on the film by bringing the film into close contact with the plurality of nozzles, measuring meniscus of ink remaining in the plurality of nozzles based on the detection pattern.


Find Patent Forward Citations

Kang, Han. (2025). Meniscus measuring apparatus and method, substrate processing apparatus (U.S. Patent No. 12251944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12251944

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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