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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12249478 B1

PDFFull Text
Date of Patent:
Mar. 11, 2025

Filed:

Dec. 09, 2021

Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system

Applicant:

Carl Zeiss Multisem Gmbh, Oberkochen, DE;

Inventors:

Hans Fritz, Grabs, CH;

András G. Major, Oberkochen, DE;

Dirk Zeidler, Oberkochen, DE;

Arne Thoma, Heidenheim, DE;

Joerg Jacobi, Herbrechtingen, DE;

Assignee:

Carl Zeiss MultiSEM GmbH, Oberkochen, DE;

Attorney:

Fish & Richardson P.C.

Primary Examiner:

David E Smith

Assistant Examiner:

Christopher J Gassen

Int. Cl.
CPC ...
H01J 37/147 (2006.01); H01J 37/09 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1475 (2013.01); H01J 37/09 (2013.01); H01J 37/28 (2013.01); H01J 2237/0453 (2013.01); H01J 2237/152 (2013.01);
Abstract

A particle beam system includes a multi-beam particle source and a magnetic multi-deflector array. The magnetic multi-deflector array includes a coil that is arranged such that, during use of the particle beam system, a multiplicity of individual particle beams substantially passes through the first coil so that they are deflected in an azimuthal direction to correct an azimuthal telecentricity error of the particle beam system so that the individual particle beams telecentrically impinge on an object plane of the particle beam system.

Find Patent Forward Citations

Fritz, Hans. (2025). Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system (U.S. Patent No. 12249478). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12249478

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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