The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Dec. 02, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Haruhiko Higuchi, Tokyo, JP;

Mitsuji Ikeda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/778 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7788 (2022.01); G06V 10/776 (2022.01);
Abstract

The preset invention aims to provide a method of presenting a learning condition which enables an improvement in the accuracy of image analysis. An information processing apparatus for machine learning is provided which includes a true/false information generating unit which generates true/false information of an image analysis result, a reliability determining unit which determines reliability related to analysis in image analysis processing, and a learning condition output unit which presents a learning condition, based on the true/false information and the reliability.


Find Patent Forward Citations

Higuchi, Haruhiko. (2025). Machine learning method and information processing apparatus for machine learning (U.S. Patent No. 12249129). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12249129

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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