The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Nov. 09, 2022
Texas Instruments Incorporated, Dallas, TX (US);
Jing-Fei Ren, Plano, TX (US);
Hrushikesh Garud, Bangalore, IN;
Rajasekhar Allu, Plano, TX (US);
Gang Hua, Katy, TX (US);
Niraj Nandan, Plano, TX (US);
Mayank Mangla, Allen, TX (US);
Mihir Narendra Mody, Bangalore, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Various embodiments disclosed herein relate to defective pixel detection and correction, and more specifically to using threshold functions based on color channels to compare pixel values to threshold values. A method is provided herein that comprises identifying a color channel of an image pixel in a frame and identifying a threshold function based at least on the color channel. The method further comprises applying the threshold function to one or more nearest-neighbor values to obtain a threshold value and determining whether a corresponding sensor pixel is defective based at least on a comparison of the image pixel to the threshold value.