Flash memory device and program method thereof using leakage current compensation

Abstract

A flash memory device includes a memory array, a first global bit line, and a sense amplifying device. The memory array includes a first memory block having a plurality of first memory cells. In a leakage current detection operation, the sense amplifying device detects a leakage current generated by the first memory cells on the first global bit line to obtain leakage current simulation information. In a program operation, the sense amplifying device provides a reference current according to the leakage current simulation information, and compares a sensing current generated by a selected memory cell in the first memory cells on the first global bit line with the reference current to perform a program verification.