The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2025

Filed:

Feb. 06, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Zhenming Zhou, San Jose, CA (US);

Murong Lang, San Jose, CA (US);

Ching-Huang Lu, Fremont, CA (US);

Nagendra Prasad Ganesh Rao, Folsom, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/0652 (2013.01); G06F 3/0679 (2013.01);
Abstract

A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a read operation on a segment of the memory device; determining whether a temperature offset value of the segment satisfies a threshold criterion associated with a program erase cycle count of the segment; and responsive to determining that the temperature offset value satisfies the threshold criterion, performing a corrective read operation on the segment of the memory device, wherein a sense time parameter of the corrective read operation is modified according to the temperature offset value and the program erase cycle count.


Find Patent Forward Citations

Quick Actions:

Zhou, Zhenming. (2025). Adaptive enhanced corrective read based on write and read temperature (U.S. Patent No. 12242755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12242755

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