The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Nov. 08, 2021
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Sung Haeng Cho, Daejeon, KR;

Byung-Do Yang, Daejeon, KR;

Sooji Nam, Daejeon, KR;

Jaehyun Moon, Daejeon, KR;

Jae-Eun Pi, Daejeon, KR;

Jae-Min Kim, Cheongju-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/02 (2006.01); H01L 27/092 (2006.01); H01L 29/24 (2006.01); H03K 19/018 (2006.01); H03K 19/0185 (2006.01); H03K 19/0948 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 27/0207 (2013.01); H01L 29/24 (2013.01); H03K 19/018521 (2013.01); H03K 19/0948 (2013.01);
Abstract

Provided is a Complementary Metal Oxide Semiconductor (CMOS) logic element. The CMOS logic element includes a substrate including a PMOS area, a circuit wiring structure including an insulating layer and a wiring layer alternately stacked on the substrate, wherein the circuit wiring structure includes an NMOS area vertically spaced apart from the PMOS area, a first transistor disposed on the PMOS area, and a second transistor disposed on the NMOS area and complementarily connected to the first transistor, wherein the first transistor includes a first gate electrode, source/drain areas formed on the PMOS area on both sides of the first gate electrode, and a first channel connecting the source and drain areas to each other, wherein the second transistor includes a second gate electrode and a second channel vertically overlapping the second gate electrode, wherein the first channel includes silicon, wherein the second channel includes an oxide semiconductor.


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