The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Feb. 16, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Carla L. Christensen, Boise, ID (US);
Bethany M. Grentz, Boise, ID (US);
Xiao Li, Boise, ID (US);
Sumana Adusumilli, Boise, ID (US);
Libo Wang, Boise, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/0601 (2023.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06Q 30/0629 (2013.01); G06Q 30/0643 (2013.01); G06T 19/006 (2013.01);
Abstract
A size comparison system may generate a size comparison by determining a size of an item based on extracted size data corresponding to the item. A comparison item is selected and the size comparison is generated between the item and the comparison item based on the size of the item. A visual rendering of the item and the comparison item is generated based on the size comparison and is displayed to a user.