The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2025
Filed:
Dec. 30, 2020
Hochschule Für Angewandte Wissenschaften Kempten Körperschaft Des Öffentlichen Rechts, Kempten, DE;
Korbinian Prause, Buchenberg, DE;
Michael Layh, Altusried, DE;
Abstract
A confocal measuring apparatus serves for 3D measurement of an object surface. The measuring apparatus has a light source for measuring light, a lens array having a plurality of array lenses, a chromatic telescope, multiplexer optics, collimation optics and spatially resolved detection device. The chromatic telescope images an object plane into an arrangement plane of the lens array. The multiplexer optics is arranged at a distance of a total of a focal length of the array lenses on the one hand and a focal length of the multiplexer optics, downstream of the lens array. A single pinhole aperture is arranged at a distance of the focal length of the multiplexer optics. The collimation optics is arranged downstream of the pinhole aperture. A confocal measuring apparatus results, which has a simplified design and at the same time a high measurement throughput.