The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Feb. 25, 2020
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Yongxin Wang, San Ramon, CA (US);

Rui-Ling Lai, San Jose, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); H01L 27/144 (2006.01); H01L 27/146 (2006.01); H01L 31/115 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
H01J 37/244 (2013.01); H01L 27/1443 (2013.01); H01L 27/14658 (2013.01); H01L 31/115 (2013.01); H01L 31/18 (2013.01); H01J 2237/2441 (2013.01); H01J 2237/2448 (2013.01);
Abstract

A detector may be provided with a sensing element or an array of sensing elements, each of the sensing elements may have a corresponding gain element. A substrate may be provided having a sensing element and a gain element integrated together. The gain element may include a section in which, along a direction perpendicular to an incidence direction of an electron beam, a region of first conductivity is provided adjacent to a region of second conductivity, and a region of third conductivity may be provided adjacent to the region of second conductivity. The sensing element may include a section in which, along the incidence direction, a region of fourth conductivity is provided adjacent to an intrinsic region of the substrate, and the region of second conductivity may be provided adjacent to the intrinsic region.


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