The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Mar. 24, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yun Li, Fremont, CA (US);

Jiangang Wu, Milpitas, CA (US);

James P. Crowley, Longmont, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0671 (2013.01); G06F 3/061 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01);
Abstract

Methods, systems, and devices for a read counter for quality of service design are described. First commands may be assigned to a first queue of a memory die of a memory sub-system, wherein the first queue is associated with a first priority level. The memory die may include a second queue associated with a second priority level different from the first priority level, the second queue comprising one or more second commands assigned. Based at least in part on a counter associated with the first queue and the first and second priority levels, it may be determined that a threshold number of the first commands of the first queue have issued without a command from the one or more second commands having issued. A command from the second commands may issue before issuing a next command of the first commands based at least in part on the counter.


Find Patent Forward Citations

Loading…