The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Sep. 07, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Sourin Sarkar, Karnataka, IN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/79 (2013.01);
U.S. Cl.
CPC ...
G06F 21/79 (2013.01); G06F 2221/2101 (2013.01);
Abstract

A system for providing forensic tracing of memory device content erasure and tampering is disclosed. The system uses a special command that enables forensic tracing in a secure memory device. Once the forensic tracing is enabled, firmware of the memory device tracks the data stored on the memory device. The command specifies whether the tracking and tracing is for the entire memory device or for a region of the memory device. The firmware confirms that the forensic tracing is enabled, and a target protection region is defined. Once an authenticated command for an operation to access, modify, or erase data of the memory device is received from a host, the system enables the operation to proceed. The system creates a trace of the operation and the metadata of the target region that is modified within a secure memory region of the memory device that is not addressable by the host device.


Find Patent Forward Citations

Sarkar, Sourin. (2025). System for forensic tracing of memory device content erasure and tampering (U.S. Patent No. 12229327). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12229327

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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