The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Jul. 04, 2024
Applicant:

Institute of Facility Agriculture, Guangdong Academy of Agricultural Sciences, Guangdong, CN;

Inventors:

Sai Xu, Guangdong, CN;

Huazhong Lu, Guangdong, CN;

Xin Liang, Guangdong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2018.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01N 23/083 (2013.01); G01N 23/04 (2013.01); G01N 2223/1016 (2013.01);
Abstract

The present disclosure discloses a non-destructive detection method and system forBradley, which includes: placing a lychee sample to be detected on a conveyor belt; acquiring sample information of the lychee sample based on visible/near-infrared light and X-ray imaging technology; wherein the visible/near-infrared light acquires internal quality features of the lychee sample; the X-ray imaging technology acquires internal density variation features of the lychee sample; analyzing the sample information according to a preset data processing and analysis method based on PLSR and a support vector machine to obtain a classification result of the lychee sample. The present disclosure uses the visible/near-infrared transmission spectrum and the X-ray imaging feature fusion in combination with PLSR to improve the detection accuracy of the lychee sample of the testing set to 92.92%, and in combination with the support vector regression to obtain a classification accuracy of 94.44% of the testing set.


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