The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Feb. 24, 2023
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Srdjan Malisic, San Jose, CA (US);
Chi Yuan, San Jose, CA (US);
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/28 (2006.01); G06F 3/06 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3668 (2013.01); G01R 31/287 (2013.01); G06F 3/0607 (2013.01); G06F 11/36 (2013.01); G06F 3/0679 (2013.01);
Abstract
Embodiments of the present invention can provide an extended NVMe driver that supports exercising virtual functions (and related physical functions) of a DUT without using a VM or hypervisor. In this way, the amount of memory and processing resources used for testing NVMe SSDs can be significantly reduced, and a large number of DUTs (e.g., up to 16 DUTs) can be tested in parallel independently. In other words, each DUT is tested in isolation, as if is the only device being tested, and there are no race conditions or competition for resources between workloads during testing.