The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Apr. 21, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Luca Porzio, Casalnuovo, IT;

Alessandro Orlando, Milan, IT;

Danilo Caraccio, Milan, IT;

Roberto Izzi, Caserta, IT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/073 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/0781 (2013.01); G06F 11/3037 (2013.01);
Abstract

Methods, systems, and devices for detecting page fault traffic are described. A memory device may execute a self-learning algorithm to determine a priority size for read requests, such as a maximum readahead window size or other size related to page faults in a memory system. The memory device may determine the priority size based at least in part on by tracking how many read requests are received for different sizes of sets of data. Once the priority size is determined, the memory device may detect subsequent read requests for sets of data having the priority size, and the memory device may prioritize or other optimize the execution of such read requests.


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