The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jul. 12, 2021
Applicant:

Tokai Optical Co., Ltd., Okazaki, JP;

Inventors:

Muneo Sugiura, Okazaki, JP;

Koichi Tamura, Okazaki, JP;

Takuro Yoshida, Okazaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 1/10 (2015.01); G06F 30/20 (2020.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G02B 27/0012 (2013.01); G02B 1/10 (2013.01); G06F 30/20 (2020.01); G06F 2111/10 (2020.01);
Abstract

In the optical product bending prediction method according to the present invention, bending δ of a substrate having a film is predicted by a computer performing calculation (steps Sto S) of the following Expressions (A1), (B1), etc., in which a and Tare set as fitting parameters and have been optimized in each coating condition using a plurality of samples. Here, σis intrinsic stress, Eis a Young's modulus of a multilayer film, vis a Poisson's ratio of the multilayer film, αis a linear coefficient expansion of the multilayer film, αis a linear coefficient expansion of the substrate, T is a room temperature, d is a film thickness, b is a substrate thickness, l is a radius of the substrate, Eis a Young's modulus of the substrate, and vis a Poisson's ratio of the substrate.


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Sugiura, Muneo. (2025). Method and program for predicting bending in optical products (U.S. Patent No. 12216274). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12216274

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