The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Dec. 16, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Violante Moschiano, Avezzano, IT;

Shyam Sunder Raghunathan, Singapore, SG;

Walter Di Francesco, Avezzano, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/32 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/32 (2013.01); G11C 16/08 (2013.01); G11C 16/102 (2013.01);
Abstract

A memory device includes an array of memory cells arranged in sub-blocks. Memory cells of a sub-block are coupled to a pillar of the array and are associated with multiple wordlines. To perform a read operation, control logic coupled with the array performs operations including: tracking a length of time that a selected wordline takes to reach a pass voltage before being able to read data from a memory cell associated with the selected wordline; in response to the length of time satisfying a first threshold criterion, causing a first delay time to pass before reading the data; and in response to the length of time satisfying a second threshold criterion that is longer than the first threshold criterion, causing a second delay time to pass before reading the data, the second delay time being longer than the first delay time.


Find Patent Forward Citations

Loading…