The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Apr. 09, 2019
Applicants:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Ecole Polytechnique Federale DE Lausanne, Lausanne, CH;
Inventors:
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Jena, DE;
Ivan Michel Antolovic, Lausanne, CH;
Claudio Bruschini, Villars-sous-Yens, CH;
Edoardo Charbon, Jouxtens-Mezery, CH;
Assignees:
Carl Zeiss Microscopy GmbH, Jena, DE;
Ecole Polytechnique Federale de Lausanne, Lausanne, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01J 1/44 (2006.01); G01N 21/64 (2006.01); G02B 21/02 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01J 1/44 (2013.01); G01N 21/6458 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01); G02B 21/02 (2013.01); G02B 21/082 (2013.01); G01J 2001/442 (2013.01);
Abstract
A light microscope has a light source for illuminating a specimen, a sensor array comprised of photon-counting detector elements for measuring detection light coming from the specimen, and a control device for controlling the sensor array. The control device is configured for flexibly binning the photon-counting detector elements into one or more super-pixels.