The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Apr. 29, 2021
Applicant:

University of Southern California, Los Angeles, CA (US);

Inventors:

Ajey Poovannummoottil Jacob, Los Angeles, CA (US);

John Damoulakis, Los Angeles, CA (US);

Akhilesh Jaiswal, Los Angeles, CA (US);

Devanand Krishna Shenoy, Los Angeles, CA (US);

Andrew Rittenbach, Fairfax, VA (US);

Assignee:

University of Southern California, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/4046 (2024.01); G06T 7/30 (2017.01); G06T 11/00 (2006.01); H01J 37/244 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 3/4046 (2013.01); G06T 7/30 (2017.01); G06T 11/003 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A method for assuring that integrated circuits are free of malicious circuit insertions and/or IC design modifications through mask swapping/addition is provided. The method includes a step of comparing 3D tomographic images constructed from design GDS to the 3D tomographic images constructed from in-line fab metrology data.


Find Patent Forward Citations

Jacob, Ajey. (2025). Ml-enabled assured microelectronics manufacturing: a technique to mitigate hardware trojan detection (U.S. Patent No. 12198325). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12198325

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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