The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Sep. 21, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Samuli Laine, Uusimaa, FI;

Timo Aila, Uusimaa, FI;

Tero Karras, Uusimaa, FI;

Gregory Muthler, Austin, TX (US);

William P. Newhall, Jr., Woodside, CA (US);

Ronald C Babich, Jr., Murrysville, PA (US);

Craig Kolb, Oakland, CA (US);

Ignacio Llamas, Palo Alto, CA (US);

John Burgess, Austin, TX (US);

Assignee:

NVIDIA CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 15/00 (2011.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 15/005 (2013.01); G06T 17/005 (2013.01);
Abstract

Methods and systems are described in some examples for changing the traversal of an acceleration data structure in a highly dynamic query-specific manner, with each query specifying test parameters, a test opcode and a mapping of test results to actions. In an example ray tracing implementation, traversal of a bounding volume hierarchy by a ray is performed with the default behavior of the traversal being changed in accordance with results of a test performed using the test opcode and test parameters specified in the ray data structure and another test parameter specified in a node of the bounding volume hierarchy. In an example implementation a traversal coprocessor is configured to perform the traversal of the bounding volume hierarchy.


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