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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12196686 B1

PDFFull Text
Date of Patent:
Jan. 14, 2025

Filed:

Aug. 23, 2024

Vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformation

Applicant:

Harbin Institute of Technology, Heilongjiang, CN;

Inventors:

Jian Liu, Heilongjiang, CN;

Chenguang Liu, Heilongjiang, CN;

Zijie Hua, Harbin, CN;

Xiaoyu You, Harbin, CN;

Assignee:

Harbin Institute of Technology, Harbin, CN;

Attorney:

M&B IP Analysts, LLC

Primary Examiner:

Jonathan M Hansen

Assistant Examiner:

Jarreas undefined Underwood

Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/95 (2006.01); G02B 21/00 (2006.01); G02B 21/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/95 (2013.01); G02B 21/0036 (2013.01); G02B 21/0052 (2013.01); G02B 21/008 (2013.01); G02B 21/10 (2013.01); G01N 2021/8822 (2013.01);
Abstract

This application provides a vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformation. An opposite-order vortex beam generation module is configured to generate a mixed vortex beam, a sample scanning module is configured to irradiate a scanning position of a to-be-measured sample by using the mixed vortex beam, to obtain a sample reflection beam. A spiral transformation module is configured to spatially separate the sample reflection beam to obtain spatially separated beams. A multi-order detection module is configured to detect the spatially separated beams to obtain a vortex dichroism signal at the scanning position. When the scanning position of the to-be-measured sample is defect-free, the vortex dichroism signal is zero. Conversely, when defects are present at the scanning position, the vortex dichroism signal is non-zero. The positive and negative the vortex dichroism signal respectively correspond to the left-handed and right-handed chirality of the defects.

Find Patent Forward Citations

Liu, Jian. (2025). Vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformation (U.S. Patent No. 12196686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12196686

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