The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Feb. 24, 2021
Applicant:

Showa Denko K.k., Tokyo, JP;

Inventors:

So Miyaishi, Tokyo, JP;

Masahiro Okubo, Tokyo, JP;

Masayuki Yoshimura, Tokyo, JP;

Wataru Sakane, Tokyo, JP;

Teppei Tanaka, Tokyo, JP;

Saeko Nakamura, Tokyo, JP;

Saori Yamaki, Tokyo, JP;

Assignee:

Resonac Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09D 5/08 (2006.01); C09D 1/00 (2006.01); C23C 14/06 (2006.01); C23C 28/04 (2006.01);
U.S. Cl.
CPC ...
C09D 5/084 (2013.01); C09D 1/00 (2013.01); C23C 14/0694 (2013.01); C23C 28/04 (2013.01);
Abstract

A corrosion-resistant member including: a metal base material (); and a corrosion-resistant coating () formed on the surface of the base material (). The corrosion-resistant coating () is a stack of a magnesium fluoride layer () and an aluminum fluoride layer () in order from the base material () side. The aluminum fluoride layer () has a first crystalline region (A) and a second crystalline region (B) containing crystalline aluminum fluoride. The first crystalline region (A) is a region in which diffraction spot arrays having regularity are observed in an electron beam diffraction image obtained by irradiation with electron beams having a beam diameter of 10 nm to 20 nm. The second crystalline region (B) is a region in which a plurality of diffraction spots is observed but diffraction spot arrays having regularity are not observed in an electron beam diffraction image obtained by irradiation with the above-described electron beams.


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