The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jun. 28, 2023
Texas Instruments Incorporated, Dallas, TX (US);
Gang Hua, Katy, TX (US);
Rajasekhar Reddy Allu, Plano, TX (US);
Mihir Narendra Mody, Bengaluru, IN;
Niraj Nandan, Plano, TX (US);
Mayank Mangla, Allen, TX (US);
Pandy Kalimuthu, Plano, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
In an advanced driver-assistance system (ADAS), RAW sensor image processing for a machine vision (MV) application is important. Due to different color, e.g., red/green/blue (RGB), color components, being focused by the lens at different locations in image plane, the lateral chromatic aberration phenomenon may sometimes be observed, which causes false color around edges in the final image output, especially for high contrast edges, which can impede MV applications. Disclosed herein are low-latency, efficient, optimized designs for chromatic aberration correction (CAC) components. An in-pipeline CAC design may be used to perform on-the-fly CAC without any out-of-pipeline memory traffic; enable use of wide dynamic range (WDR) sensors; uses bicubic interpolation; support vertical and horizontal chromatic aberration color channel offsets, reduce CAC line memory requirements, and support flexible look-up table (LUT) down-sampling factors to improve the spatial precision of correction and accommodate popular image sensor resolutions.