The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Aug. 27, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Yeh-Hsun Fang, Taipei, TW;

Zhi-Wei Zhuang, Hsinchu, TW;

Li-Hsin Chu, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01J 1/44 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1461 (2013.01); G01J 1/44 (2013.01); H01L 24/08 (2013.01); H01L 24/80 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01); H01L 27/14634 (2013.01); H01L 27/14636 (2013.01); H01L 27/1469 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01);
Abstract

A method of forming a semiconductor device includes: forming a patterned hard mask layer on a semiconductor substrate; performing a first etching process to form a recess in an exposed portion of the semiconductor substrate, using a first etchant that includes a first halogen species; performing a second etching process using a second etchant that includes a second halogen species, such that the second halogen species forms a barrier layer in the semiconductor substrate, surrounding the recess; and growing a detection region in the recess using an epitaxial growth process. The barrier layer is configured to reduce diffusion of the first halogen species into the detection region.


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