The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Apr. 17, 2019
The Chinese University of Hong Kong, Hong Kong, CN;
Yuk-Ming Dennis Lo, Hong Kong SAR, CN;
Rossa Wai Kwun Chiu, Hong Kong SAR, CN;
Kwan Chee Chan, Hong Kong SAR, CN;
Peiyong Jiang, Hong Kong SAR, CN;
Cheuk Yin Jandy Yu, Hong Kong SAR, CN;
The Chinese University of Hong Kong, New Territories, HK;
Abstract
An aberration in a fetal genome can be identified by analyzing a sample of fetal and maternal DNA. Classifications of whether an aberration (amplification or deletion) exists in a subchromosomal region are determined using count-based and size-based methods. The count classification and the size classification can be used in combination to determine whether only the fetus or only the mother, or both, have the aberration in the subchromosomal region, thereby avoiding false positives when the mother has the aberration and the fetus does not.