The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jun. 02, 2022
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Rebecca Elsaesser, Jena, DE;
Wibke Hellmich, Jena, DE;
Alexander Freytag, Erfurt, DE;
Volker Doering, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); A61K 35/12 (2015.01); G01N 21/64 (2006.01); G06T 7/00 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G01N 21/6428 (2013.01); G06T 7/0014 (2013.01); G06V 10/776 (2022.01); G01N 2021/6439 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30204 (2013.01);
Abstract
A prediction algorithm determines synthetic fluorescence images on the basis of measurement images. A validation of the synthetic fluorescence images can be effected on the basis of reference images which are captured after the measurement images or are captured for a separate sample. Alternatively or additionally, a training of the prediction algorithm can be effected on the basis of training images which are captured after the measurement images or are captured for a separate sample.