The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Aug. 04, 2023
Applicant:
Nidec Instruments Corporation, Nagano, JP;
Inventors:
Hiroshige Takeda, Nagano, JP;
Takeshi Segawa, Nagano, JP;
Yasushi Kasahara, Nagano, JP;
Takahiro Matsuzawa, Nagano, JP;
Assignee:
NIDEC INSTRUMENTS CORPORATION, Nagano, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/00 (2006.01); G06K 13/08 (2006.01); G07F 19/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/0091 (2013.01); G06K 13/0868 (2013.01); G07F 19/2055 (2013.01);
Abstract
A foreign matter detection device which detects a foreign matter in an inside of a card reader. The foreign matter detection device includes a control part which performs control for causing an imaging device provided in the inside of the card reader to image a space in the inside of the card reader, and a detection part which detects the foreign matter in the space by image analysis based on a captured image obtained by the imaging device.