The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jan. 24, 2024
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Daniel James Gunderson, Longmont, CO (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01); G06F 11/1402 (2013.01);
Abstract
Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.