The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Feb. 01, 2023
Applicant:
Changxin Memory Technologies, Inc., Hefei, CN;
Assignee:
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31704 (2013.01); G01R 31/31701 (2013.01); G01R 31/31722 (2013.01);
Abstract
A method for checking a Design for Test (DFT) circuit includes: transmitting a control signal to the DFT circuit to determine test mode signals output by the DFT circuit, with the DFT circuit being configured to sequentially select multiple address latches according to the control signal to output the test mode signals; analyzing the test mode signals to determine whether the multiple address latches in the DFT circuit have an error; and outputting a simulation result report.
Shi, Teng. (2024). Method for checking dft circuit, test platform, storage medium and test system (U.S. Patent No. 12174250). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12174250
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile