The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Jun. 02, 2022
Applicant:

Advantest Test Solutions, Inc., San Jose, CA (US);

Inventors:

Karthik Ranganathan, Foothill Ranch, CA (US);

Gregory Cruzan, Anaheim, CA (US);

Gilberto Oseguera, Corona, CA (US);

Toshiyuki Kiyokawa, Kukishi Saitama, JP;

Takayuki Shigihara, Tokyo, JP;

Assignee:

Advantest Test Solutions, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/20 (2006.01); G01R 31/27 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2887 (2013.01); G01R 31/2834 (2013.01);
Abstract

A testing apparatus includes a tester rack with a plurality of slots where at least one slot in the tester rack is a dedicated slot operable to receive a test interface board (TIB) from a back of the tester rack, where the back of the tester rack is opposite a front of a tester rack, and where the front of the tester rack faces a handler and a front-facing elevator. The apparatus also includes a handler operable to load devices under test (DUTs) onto the TIB and a front-facing elevator move the TIB from the dedicated slot to an available slot in the tester rack, wherein the available slot includes power electronics operable to connect to the TIB to test devices under test (DUT) disposed on the TIB.


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