The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Sep. 07, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Daniel Schwedt, Jena, DE;
Tiemo Anhut, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for evaluating measurement data from a light field microscope, and an apparatus for light field microscopy wherein the following steps are carried out: a) at least one sample position to be analyzed is selected in a sample; b) images of the sample, which each contain a set of partial images, are recorded at a sequence of recording times using a light field microscope; c) the positions corresponding to the selected sample positions are determined in the partial images of the images recorded in step b); d) the image signals are extracted from at least some of the partial images at the positions determined in partial step c); e) an integrated signal is obtained for a certain recording time by virtue of the image signals extracted for a certain position from partial images of this recording time in step d) being integrated to form the integrated signal; and f) a time profile of the integrated signal is obtained by virtue of step e) being carried out for a plurality of recording times.