The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2024

Filed:

Aug. 22, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Aaron P. Boehm, Boise, ID (US);

Scott E. Schaefer, Boise, ID (US);

Scott D. Van De Graaff, Boise, ID (US);

Mark D. Ingram, Boise, ID (US);

Todd Jackson Plum, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/24 (2006.01); G11C 7/04 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 7/24 (2013.01); G11C 7/04 (2013.01); G11C 7/1063 (2013.01);
Abstract

Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.


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