The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Feb. 25, 2019
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventors:

Yoko Iwakaji, Tokyo, JP;

Tomoko Matsudai, Tokyo, JP;

Takeshi Suwa, Kawasaki Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/417 (2006.01); H01L 29/08 (2006.01); H01L 29/16 (2006.01); H01L 29/423 (2006.01); H01L 29/739 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7395 (2013.01); H01L 29/0804 (2013.01); H01L 29/0821 (2013.01); H01L 29/16 (2013.01); H01L 29/41708 (2013.01); H01L 29/42356 (2013.01); H01L 29/7391 (2013.01);
Abstract

A semiconductor device includes a semiconductor layer having a first plane and a second plane; an emitter electrode on a side of the first plane; at least one collector electrode on a side of the second plane; a first gate electrode on the side of the first plane; at least one second gate electrode on the side of the second plane; a drift region of a first conductivity-type in the semiconductor layer; a collector region of a second conductivity-type in the semiconductor layer; and a first conductivity-type region of the first conductivity-type provided between a part of the collector region and the second plane, wherein the semiconductor device has a first effective gate distance and a second effective gate distance different from the first effective gate distance.


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