The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Sep. 13, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Raja Kumar Varma Manthena, Boise, ID (US);

Paolo Tessariol, Arcore, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10B 41/10 (2023.01); H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 23/528 (2006.01); H01L 29/06 (2006.01); H10B 41/20 (2023.01); H10B 41/35 (2023.01); H10B 43/10 (2023.01); H10B 43/20 (2023.01); H10B 43/35 (2023.01);
U.S. Cl.
CPC ...
H01L 21/76877 (2013.01); H01L 21/76831 (2013.01); H01L 23/5226 (2013.01); H01L 23/5283 (2013.01); H01L 29/0649 (2013.01); H10B 41/10 (2023.02); H10B 41/20 (2023.02); H10B 41/35 (2023.02); H10B 43/10 (2023.02); H10B 43/20 (2023.02); H10B 43/35 (2023.02);
Abstract

A method of forming a microelectronic device comprises forming a stack structure over a source structure, forming pillar structures vertically extending through the stack structure, and forming at least one trench vertically extending through the stack structure. The at least one trench defines at least one stadium structure comprising opposing stair step structures having steps comprising horizontal ends of tiers. Additional trenches may be formed to vertically extend through the stack structure, and at least one further trench may be formed to vertically extend through the stack structure. The at least one further trench defines at least one additional stadium structure comprising additional opposing stair step structures having additional steps comprising additional horizontal ends of the tiers. A dielectric material may be formed within the at least one trench, the additional trenches, and the at least one further trench. Microelectronic devices, memory devices, and electronic systems are also described.


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