The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Nov. 22, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Karl D. Schuh, Santa Cruz, CA (US);

Jeffrey S. McNeil, Jr., Nampa, ID (US);

Kishore K Muchherla, Fremont, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Jiangang Wu, Milpitas, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G06F 12/02 (2006.01); G11C 16/14 (2006.01); G11C 16/26 (2006.01); G11C 29/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3418 (2013.01); G06F 12/0253 (2013.01); G11C 16/14 (2013.01); G11C 16/26 (2013.01); G11C 29/10 (2013.01); G06F 2212/7211 (2013.01);
Abstract

A system includes a memory device including a plurality of groups of memory cells and a processing device that is operatively coupled to the memory device. The processing device is to receive a request to determine a reliability of the plurality of groups of memory cells. The processing device is further to perform, in response to receipt of the request, a scan operation on a sample portion of the plurality of groups of memory cells to determine a reliability of the sample portion that is representative of the reliability of the plurality of groups of memory cells.


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