The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Dec. 21, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Venkata Ravishankar Kasibhotla, Bengaluru, IN;

Tao Zhang, San Ramon, CA (US);

Xiaoqun Zou, Danville, CA (US);

Bala Shyamala Balaji, Bengaluru, IN;

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); G06N 20/00 (2019.01); G05B 2219/37506 (2013.01);
Abstract

A method includes receiving first sensor data, generated during a manufacturing process by sensors associated with a substrate manufacturing chamber. The method further includes receiving simulated sensor data generated by a trained physics-based model. The method further includes determining which one or more components of the manufacturing chamber contribute to a difference between the first sensor data and the simulated sensor data. The method further includes causing performance of a corrective action in view of the difference.


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