The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Jun. 19, 2023
Applicant:

Rearden, Llc, Palo Alto, CA (US);

Inventor:

Stephen G. Perlman, Palo Alto, CA (US);

Assignee:

Rearden, LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); G02B 5/18 (2006.01); H04N 23/60 (2023.01); H04N 25/70 (2023.01); H04N 25/75 (2023.01);
U.S. Cl.
CPC ...
G01T 1/295 (2013.01); G02B 5/1842 (2013.01); H04N 23/60 (2023.01); H04N 25/70 (2023.01); H04N 25/75 (2023.01);
Abstract

An apparatus and method are described for capturing images in visible light as well as other radiation wavelengths. In one embodiment, the apparatus comprises: a diffraction coded imaging system including a plurality of apertures arranged in a diffraction coded array pattern with opaque material blocking array elements not containing apertures; and a light- or radiation-sensitive sensor coupled to the diffraction coded imaging system array and positioned at a specified distance behind the diffraction coded imaging system array, the radiation-sensitive sensor configured to sense light or radiation transmitted and diffracted through the apertures in the diffraction coded imaging system array.


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