The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Mar. 16, 2021
Advantest Corporation, Tokyo, JP;
Yuji Sakai, Tokyo, JP;
Hajime Sugimura, Saitama, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
There is provided an analysis apparatus including: an acquisition unit configured to acquire a plurality of measured values obtained by measuring a device under measurement; a machine learning unit configured to use the plurality of measured values to learn, by machine learning, a model of a position-dependent component that depends on a measured position in the device under measurement; and an analysis unit configured to separate, from the plurality of measured values, the position-dependent component which is calculated by using the model learned by the machine learning unit. Further, there is provided an analysis method. Further, there is provided a recording medium having recorded thereon an analysis program.